MaxLab Technology (M) Sdn. Bhd.

Scientific Laboratory Equipment Supplier (since 2007) for Malaysia,Singapore,Vietnam,Indonesia,Philippines,Thailand,Myanmar,Laos,Brunei,Cambodia

atomic force microscope

Scanning Probe Microscope (SPM) is  a family of  microscopes that observe the interactions between  sample surfaces and a sharpened probe and  measure the field distribution of the surface force, current and optical properties which work between them and present the output in the form of high-resolution 3-dimensional nano-scale images.

Scanning Tunneling Microscope (STM ), observes a form of sample surface using minute "tunneling currents," which flow between the probe and a sample .  Atomic Force Microscope (AFM)  performs topography imaging using minute "atomic force" produced between a sharpened probe and a sample surface . The technological development of SPM's are rapidly advancing at the  pace of that of nanotechnology which is  the technology of treating the minute world of atoms and molecules .

related articles

Copyright Disclaimer:
This site does not store any files on its server. We only index and link to content provided by other sites. Please contact the content providers to delete copyright contents if any and email us, we'll remove relevant links or contents immediately.